Advances in technology are nowadays more and more based on opto-electronic materials and thin films. Optimization of these materials requires state of the art tools for surface and solid state analysis. Topics of interest are the determination of residual bulk and surface impurities, doping control of seminconductors, diffusion phenomena at interfaces, behaviour of microscopic defects and recombination centers, optical response, determination of the dielectric function, carrier concentration and mobilities, band structure and bonding in thin films.
Not every research or development laboratory covers the whole range of analytical tools and the know how of PASS in the field of surface and solid state analysis. We accomplish simple and fast routine measurements as well as detailed studies to solve complex material problems. Moreover we offer proposals for materials and device optimization.

Our service covers:

1. Surface and thin film analysis
   • photo electron spectrometry (Auger, XPS/ESCA, UPS)
   • secondary ion mass spectrometry (SIMS)
2. Optical characterization
   • absorption in the spectral range from UV to IR (0.185 - 50 µm)
   • spectral analysis of light and luminescence
   • determination of polarization properties
3. Determination of electrical properties
   • conductivity and Hall measurements (4 - 800 K)
4. Magnetic resonance spectroscopy
   • ESR, ENDOR, ODMR